AI Parameter Vulnerability to SDCs

Arxiv pdf 2024-05-01T00:00:00
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Abstract

Reliability of AI systems is a fundamental concern for the successful deployment and widespread adoption of AI technologies. Unfortunately, the escalating complexity and heterogeneity of AI hardware systems make them increasingly susceptible to hardware faults, e.g., silent data corruptions (SDC), that can potentially corrupt model parameters. When this occurs during AI inference/servicing, it can potentially lead to incorrect or degraded model output for users, ultimately affecting the quality and reliability of AI services. In light of the escalating threat, it is crucial to address key questions: How vulnerable are AI models to SDCs, and how do different parts (such as modules and layers) of the models exhibit varying vulnerability levels to SDCs? To answer this question, we propose a novel quantitative metric, Parameter Vulnerability Factor (PVF), inspired by architectural vulnerability factor (AVF) in computer architecture community, aiming to standardize the quantification of AI model vulnerability against SDCs. We define a model parameters PVF as the probability that a corruption in that particular model parameter will result in an incorrect output. Similar to AVF, this statistical concept can be derived from statistically extensive and meaningful fault injection (FI) experiments. In this paper, we present several use cases on applying PVF to three types of tasks/models during inference recommendation (DLRM), vision classification (CNN), and text classification (BERT), while presenting an in-depth vulnerability analysis on DLRM. In DLRM, our FI results show that different parts of DLRM present different vulnerability levels: top-MLP layers are the most vulnerable parameter component, while embedding tables exhibit comparatively lower vulnerability level. PVF has been a critical metric used for making key error management design decisions in productionizing Metas in-house AI chip - MTIA [5].

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